Preparation, crystallization, microstructure and dielectric properties of lead bismuth titanate borosilicate glass ceramics

doi:10.1007/s40145-014-0110-4

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Abstract

Various bulk and transparent glasses were prepared by rapid melt quenching technique in the glass system 55[(Pb_xBi_1-x)TiO₃]–44[2SiO₂B₂O₃]–La₂O₃ (x = 0–0.7). The X-ray diffraction (XRD) studies of the glass samples confirmed the amorphous nature. The differential thermal analyses (DTA) were carried out from room temperature to 900 ℃ with a heating rate of 10 ℃/min. The DTA patterns of the samples showed one or more exothermic sharp peaks shifting towards lower temperature side with increasing concentration of bismuth oxide (BiO). On the basis of DTA results, the solid solution of bismuth titanum oxide (Bi₂Ti₂O₇)/lead bismuth titanium oxide (Pb₃Bi₄Ti₆O₂₁) was precipitated in borosilicate glassy matrix as a major phase. The glasses were subjected to 4 h and 8 h heat treatment schedules to convert into glass ceramics. XRD analysis of these glass ceramic samples showed that the major crystalline phase of the entire glass ceramic samples with 0 ≤ x ≤ 0.5 is found to have cubic crystal structure, while it is tetragonal for glass ceramic sample with x = 0.7. The scanning electron microscopy (SEM) micrographs indicated the uniform distribution of Bi₂Ti₂O₇ and Pb₃Bi₄Ti₆O₂₁ crystallites in the glassy matrix.

Key words： lead bismuth titanate differential thermal analysis (DTA) crystallization scanning electron microscopy (SEM) dielectric behavior

Received: 10 April 2014 Published: 11 June 2015

Corresponding Authors: Chandkiram R. GAUTAM

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	Chandkiram R. GAUTAM
	Abhishek MADHESHIYA
	Ranabrata MAZUMDER

Cite this article:

Chandkiram R. GAUTAM,Abhishek MADHESHIYA,Ranabrata MAZUMDER. Preparation, crystallization, microstructure and dielectric properties of lead bismuth titanate borosilicate glass ceramics[J]. Journal of Advanced Ceramics, 2014, 3(3): 194-206.

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http://jac.tsinghuajournals.com/EN/10.1007/s40145-014-0110-4 OR http://jac.tsinghuajournals.com/EN/Y2014/V3/I3/194

Nomenclature of glass samples, their compositional distribution and glass transition temperature, DTA peak and density of various glass samples in the system 55[(Pb_xBi_1-x)TiO₃]–44[2SiO₂B₂O₃]–La₂O₃

Glass ceramic code, density, heating rate, holding time, holding temperature, crystal structure and crystalline phase

XRD patterns of glass samples with (a) x = 0, (b) x = 0.1, (c) x = 0.3, (d) x = 0.5 and (e) x = 0.7 in the glass system 55[(Pb_xBi_1-x)TiO₃]– 44[2SiO₂B₂O₃]–La₂O₃.

DTA patterns of glass samples with (a) x = 0, (b) x = 0.1, (c) x = 0.3, (d) x = 0.5 and (e) x = 0.7 in the glass system 55[(Pb_xBi_1-x)TiO₃]– 44[2SiO₂B₂O₃]–La₂O₃.

Glass ceramic sample code, average crystallite and grain size

XRD patterns of different glass ceramic samples: (a) BTL0.0626F, (b) PBTL0.1631F, (c) PBTL0.3624F, (d) PBTL0.5622F, (e) PBTL0.7629F and (f) PBTL0.7770F.

XRD patterns of different glass ceramic samples: (a) BTL0.0626E, (b) PBTL0.1631E, (c) PBTL0.3624E, (d) PBTL0.5622E, (e) PBTL0.7629E and (f) PBTL0.7770E.

SEM micrographs of glass ceramic samples: (a) BTL0.0626F, (b) PBTL0.1631F, (c) PBTL0.3624F, (d) PBTL0.5622F, (e) PBTL0.7629F and (f) PBTL0.7770F.

SEM micrographs of glass ceramic samples: (a) BTL0.0626E, (b) PBTL0.1631E, (c) PBTL0.3624E and (d) PBTL0.3624E (at lower magnification).

SEM micrographs of glass ceramic samples: (a) PBTL0.5622E, (b) PBTL0.7629E and (c) PBTL0.770E.

Variations of (a) dielectric constant ε_r and (b) dissipation factor D with temperature at different frequencies for the glass ceramic sample PBTL0.3624F.

Variations of (a) dielectric constant ε_r and (b) dissipation factor D with temperature at different frequencies for the glass ceramic sample PBTL0.5622F.

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