Mechanical and dielectric behaviors of perovskite (Ba,Sr)TiO<sub>3</sub> borosilicate glass ceramics

doi:10.1007/s40145-014-0104-2

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Abstract

Perovskite (Ba,Sr)TiO₃ glass ceramics were crystallized in the presence of La₂O₃ for glass ceramic system [(Ba_1-xSr_x)TiO₃]–[2SiO₂–B₂O₃]–[K₂O]–[La₂O₃] (x = 0.0 and 0.4). The formation of major crystalline phase of BaTiO₃ along with secondary phase of Ba₂TiSi₂O₈ was confirmed by X-ray diffraction (XRD) studies. Major crystalline phase was clearly seen in the micrographs of (Ba,Sr)TiO₃ borosilicate glass ceramic samples. The prepared glass ceramic samples showed very high values of toughness and elastic modulus. Barium strontium titanate (BST) glass ceramics are used in barrier layer capacitors for storage of high energy due to their very high dielectric constant and low dielectric loss.

Key words： (Ba,Sr)TiO₃ X-ray diffraction (XRD) scanning electron microscopy (SEM) elastic modulus dielectric constant

Received: 18 February 2014 Published: 12 June 2015

Corresponding Authors: Avadhesh Kumar YADAV

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	Avadhesh Kumar YADAV
	C. R. GAUTAM
	Abhinay MISHRA

Cite this article:

Avadhesh Kumar YADAV,C. R. GAUTAM,Abhinay MISHRA. Mechanical and dielectric behaviors of perovskite (Ba,Sr)TiO₃ borosilicate glass ceramics[J]. Journal of Advanced Ceramics, 2014, 3(2): 137-146.

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http://jac.tsinghuajournals.com/EN/10.1007/s40145-014-0104-2 OR http://jac.tsinghuajournals.com/EN/Y2014/V3/I2/137

Sample code, density, crystallite size, breaking strength, elastic modulus, strain and toughness of glass ceramic samples

XRD pattern of glass ceramic sample BT5K1L0.0T850.

XRD pattern of glass ceramic sample BT5K1L0.0S850.

XRD pattern of glass ceramic sample BST5K1L0.4T850.

XRD pattern of glass ceramic sample BST5K1L0.4S850.

WH plot of glass ceramic sample BT5K1L0.0T850.

WH plot of glass ceramic sample BT5K1L0.0S850.

WH plot of glass ceramic sample BST5K1L0.4T850.

WH plot of glass ceramic sample BST5K1L0.4S850.

SEM micrograph of glass ceramic sample BT5K1L0.0T850.

SEM micrograph of glass ceramic sample BT5K1L0.0S850.

SEM micrograph of glass ceramic sample BST5K1L0.4T850.

SEM micrograph of glass ceramic sample BST5K1L0.4S850.

Variations of compressive strain vs. compressive stress: (a) BT5K1L0.0T850 and (b) BT5K1L0.0S850.

Variations of compressive strain vs. compressive stress: (a) BST5K1L0.4T850 and (b) BST5K1L0.4S850.

εr and (b) dissipation factor tanδ with temperature at different frequencies for glass ceramic sample BT5K1L0.0T850.">

Variations of (a) dielectric constant εr and (b) dissipation factor tanδ with temperature at different frequencies for glass ceramic sample BT5K1L0.0T850.

εr and (b) dissipation factor tanδ with temperature at different frequencies for glass ceramic sample BST5K1L0.4T850.">

Variations of (a) dielectric constant εr and (b) dissipation factor tanδ with temperature at different frequencies for glass ceramic sample BST5K1L0.4T850.

Dielectric characteristics of glass ceramic samples BT5K1L0.0T850, BT5K1L0.0S850, BST5K1L0.4T850 and BST5K1L0.4S850

εr and (b) dissipation factor tanδ with temperature at different frequencies for glass ceramic sample BT5K1L0.0S850.">

Variations of (a) dielectric constant εr and (b) dissipation factor tanδ with temperature at different frequencies for glass ceramic sample BT5K1L0.0S850.

εr and (b) dissipation factor tanδ with temperature at different frequencies for glass ceramic sample BST5K1L0.4S850.">

Variations of (a) dielectric constant εr and (b) dissipation factor tanδ with temperature at different frequencies for glass ceramic sample BST5K1L0.4S850.

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